TTTC Press Release: Zorian Named Recipient of IEEE Industrial Pioneer Award

TTTC PRESS RELEASE

As it was recently reported in EE Times (http://eet.com/news/design/showArticle.jhtml;
jsessionid=ZF43AZSMCM0SQQSNDBCSKH0CJUMEKJVN?articleID=164901657) the 2005 IEEE Industrial Pioneer Award has been presented to Dr. Yervant Zorian at the Opening Session of the Design Automation Conference in Anaheim. Dr. Zorian was awarded the Industrial Pioneer of this year for his contributions to design for test technology through Built-In Self Test (BIST) solutions and design tools that dramatically boosted the quality and reliability of digital systems and efficiency of design and test engineers.

Dr. Zorian started his career at AT&T Bell Labs after completing his Ph.D. on BIST from McGill University. ‚He immediately demonstrated high levels of innovation that made the Bell Labs BIST Group quickly become of world-wide reputation‛, said Rod Tulloss, the founder and head of the BIST/Boundary-Scan Program at Bell Labs from 1985 to 1995 and the winner of the 2004 Test Technology Lifetime Contribution Medal, ‚Yervant is one of the greatest individuals that the test field has ever known. His self-test solutions were far beyond the market at the time and still much in use today. We continue to benefit and learn from Yervant's outstanding technical and leadership abilities. He has been truly remarkable"!

Since 2000, Yervant Zorian has served as Vice President and Chief Scientist at Virage Logic Corporation. Prior to that, he served as Chief Technology Advisor at Logic Vision. He also serves on the Board of Directors of public and privately owned companies. ‚The Self-Test and repair capabilities that Dr. Zorian developed for SoCs have become the de facto standard in 90-nanometer technology for much of the electronics designed around the world‛ said Adam Kablanian, president and CEO of Virage Logic. ‚His pioneering vision of providing an effective test technology solution integrated with IP has enabled Virage Logic to deliver a proven path for design success at the advanced process geometries of 130nm and below.‛ Dr. Zorian continues to innovate by architecting a range of products for embedded test and yield optimization and he holds numerous patents.

Throughout his career, Dr. Zorian led the test community through its IEEE Test Technology Technical Council and many of its conferences. He founded test standardization efforts, such as IEEE 1500, and chaired numerous workshops and editorial boards, such as the Board of the IEEE Design & Test Computers. In 2003, he was named by EE Times as one of thirteen people ‚who are influencing the course of semiconductor development technology and taking it into realms that exceed the bounds set by the inventors of the transistor more than fifty years ago‛.

‚For more than 15 years, Dr. Zorian’s contributions have enriched the Test, IP, EDA and semiconductor technologies‛, said Kamalesh Ruparel, Director at Cisco Systems. ‚Yervant spots trends well before they become main stream and possesses the credibility to rally fellow industry experts. His talent to articulate original ideas and technical prowess enable him to execute complex concepts into realistic, applicable solutions‚.

According to Gary Smith, chief analyst, Gartner Dataquest, ‚Yervant is one of the true visionaries in today's world of Design. Yervant has played an invaluable role in the "infrastructure" of the design world.‛

Every year, the IEEE Circuits and Systems Society dedicates the Industrial Pioneer award to honor an outstanding and pioneering scientist who successfully translates academic research results into commercial products or applications. Past recipients of the IEEE Industrial Pioneer Award in the recent few years include: Aart de Geus, CEO of Synopsys, Henry Samueli, Cofounder and Chairman of Broadcom Corporation, and Prabhu Goel, Chairman of iPolicy Networks.

A Fellow of the IEEE and an honorary doctor of the Armenian National Academy of Sciences, Dr. Zorian continues to author books, publish extensively and deliver keynotes around the world. ‚His vision, expertise and pioneering efforts made BIST a common practice in the semiconductor industry and dramatically boosted the quality, reliability and manufacturability of today’s products‛, said Andre Ivanov, Chair of the IEEE Test Technology Technical Council.